ARIES ELECTRONICS / LARSEN ASSOCIATES
Chip Scale Test & Burn-In Sockets Test & Burn-In of Any SMT Device! CSP BGA LGA QFN DSP SRAM DRAM Flash Devices, etc.
"Aries, the world leader in Spring Probe Test & Burn-In Socket Technology"
Optical Lens Window Test Sockets
Optical Lens Window Test Sockets:

NEW, state-of-the-art, Optical Lens / Window Test Sockets from Aries Electronics.

Shown is an Aries 23016 style socket with a Quartz glass window that allows for 100% of the top of the DUT to be optically exposed for testing. The optical grade Quartz glass window has a 98% transmission rate. Window & lens materials are available in glass, sapphire, & plastic. Also available with filters for UV or infrared and full spectrum applications. The socket shown matches the 23017/24008 socket footprints for optical testing so your other test sockets can be interchangeable. Testing an optical sensor type chip or testing a standard chip using an infrared heat sensor, Aries optical test sockets can be customed designed for your exact application. Aries Electronics is a top innovator in test socket design.

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