Aries Electronics / Larsen Associates
Test Sockets, Burn-In Sockets, IC Adaptors, Display Sockets, plus Standard & Custom Packaging Solutions
Test & Burn-in Sockets / IC Adapters "Correct-A-Chip™"/ High Temperature Sockets / Display Sockets / Contact US
High-Temperature,up to 300°C, Test & Burn-in Test Sockets
Data Sheet PDF
10002HT
High-Temp (up to 300°C) Universal DIP ZIF Burn-in & Test Sockets – accepts devices on 0.300 to 0.600 [7.62 to 15.24] centers in packages from 24- thru 48-pin
High-Temperature, up to 200°C, Test & Burn-in Test Sockets
Data Sheet PDF 10004HT
High-Temp (up to 200°C) Universal PGA ZIF Burn-in & Test Sockets – for any footprint on standard 8x8 to 21x21 grids
High-Temperature, up to 200°C, Test & Burn-in Test Sockets
Data Sheet PDF 23026HT
High-Temp (up to 200°C) CSP Burn-in & Test Sockets for BGA, LGA, QFN, MLCC, and Bumped Die Devices or Any Custom Machined Configuration – for high-frequency bandwidth, low inductance, and high-current applications in a reliable and durable socket housing
High-Temperature, up to 250°C, Test & Burn-in Test Sockets
Data Sheet PDF 24001HT
High-Temp (up to 250°C) RF Test Socket with Replaceable Contact Strips – for all peripheral-leaded devices including MLF, QFN, QFP with very low inductance
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